As artificial intelligence rapidly reshapes how organisations build products, manage risk, serve customers and run operations, the need for professionals who can design, deploy and govern intelligent ...

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Abstract: Multistate flow network (MFN) reliability problem has attracted considerable interest in the past decades. MFN reliability subject to flow loss, defined as the probability that the demand at ...

Abstract: The presence of impulsive noise can significantly compromise the localization accuracy of partial discharge (PD). To address this problem, the direct data-reusing time-delay estimation (TDE) ...