Abstract: For the improvement of processing-in-memory (PIM) yield, an efficient test architecture for the processing unit (PU) is necessary. While scan-based tests can achieve high test coverage, the ...
Abstract: In recent years, multipulse rectifiers, which use passive harmonic suppression circuits, have been the focus of many researchers. They are considered an effective method to improve the ...
A Claude skill for designing comprehensive test cases using PICT (Pairwise Independent Combinatorial Testing). This skill enables systematic test case design with minimal test cases while maintaining ...
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